FTIR microscopy is a robust analytical method used to identify contaminants at specific locations within a sample. By using visual imaging to pinpoint the exact location of contamination, an infrared ...

Portable balancing systems enable faster on-wing corrections, minimizing shop visits and easing maintenance bottlenecks.

Yield loss from contamination demands more than detection. Learn how integrated inspection, materials analysis, and process correlation establish defensible root cause in semiconductor fabs.

Portable particle size analysis offers quick, reliable measurement of particle populations to support process control.

NIRS allows for the rapid, chemical-free measurement of fat, protein, sugars, total solids, and calories to support ...

Near-infrared spectroscopy allows for the continuous detection of wheat flour adulteration, helping protect food safety, ...

Learn how NIRS allows for the rapid measurement of caffeine and moisture in roasted coffee beans, helping roasters optimize ...

A research team led by Professor Lu Jian, Dean of the College of Engineering and Chair Professor in the Department of ...

In standard, multi-range FT-IR applications, the spectrometer must be opened to swap beamsplitters, requiring careful handling of expensive parts and exposing internal optics to the environment by ...

At JEC World 2026, Syensqo will demonstrate how its advanced composite technologies are accelerating high-rate manufacturing, enabling mission-critical performance, and advancing circularity across ...

Engineered for extreme conditions, radiation-resistant materials are crucial for spacecraft, maintaining stability and performance in harsh space environments.

Gallium nitride (GaN) is a promising semiconductor material that outperforms silicon-based devices. However, optimal performance requires high-quality GaN. Photoluminescence (PL) spectroscopy is a non ...